photometrics.net
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  • Analyses and Consultations
    • Adhesive Failure Analysis
    • Chemical and Material Analysis
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    • Contamination and Corrosion Identification
    • Failure Analysis
    • Litigation Support
    • Metallurgical Failure Analysis
    • Semiconductor Constructional Analysis
    • Surface Analysis
    • Surface Roughness
    • Thermal Analysis TGA
  • Analytical Techniques
    • Differential Scanning Calorimetry (DSC)
    • Energy Dispersive Spectroscopy (EDS)
    • Field Emission Scanning Electron Microscopy (FESEM)
    • Fourier Transform Infrared (FTIR) Spectroscopy
    • In-Lens Field Emission Scanning Electron Microscopy (In-Lens FESEM)
    • Optical Microscopy
    • Scanning Auger Microanalysis (SAM)
    • Scanning Electron Microscopy (SEM)
    • Scanning Probe Microscopy (SPM)/Atomic Force Microscopy (AFM)
    • Thermogravimetric Analysis (TGA)
    • Wavelength Dispersive Spectroscopy (WDS)
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Gallery

Aluminum-Bond-Purple-Intermetallic
Aluminum-Microstructure
BGAWP
Cracked-Cap
Cross-Section-Cracked-copper-Trace

Ductile-Overload
Fracture-Macro1
Green-Material-on-Coil-pic
HAZ-Crack
In-Lens-Thin-Film-Stack

PhotoResist
PR1
PTH-Hole-Fill
SS-Mesh
TIN-20K


What We Do

PhotoMetrics provides solutions, not just data. Because a team approach is the most effective way to solve problems, we encourage client involvement. 

Results

By combining your input, our staff, and the proper analytical techniques, we can assure you a rapid solution to your materials or process challenges.

Contact Us

Phone: 714-895-4465
Fax: 714-893-4682

E-mail: lab@photometrics.net

Address

PhotoMetrics, Inc.
15801 Graham St.
Huntington Beach, CA 92649


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