• Home Page
  • About Us
  • Analyses & Consultation
    • Adhesive Failure Analysis
    • Chemical and Material Analysis
    • Coating Thickness and Composition
    • Contamination and Corrosion Identification
    • Failure Analysis
    • Litigation Support
    • Metallurgical Failure Analysis
    • Semicondustor Constructional Analysis
    • Surface Analysis
    • Surface Roughness
    • Thermal Analysis TGA
  • Analytical Techniques
    • Differential Scanning Calorimetry (DSC)
    • Energy Dispersive Spectroscopy (EDS)
    • Field Emission Scanning Electron Microscopy (FESEM)
    • Fourier Transform Infrared (FTIR) Spectroscopy
    • In-Lens Field Emission Scanning Electron Microscopy (In-Lens FESEM)
    • Optical Microscopy
    • Scanning Auger Microanalysis (SAM)
    • Scanning Electron Microscopy (SEM)
    • Scanning Probe Microscopy (SPM)/Atomic Force Microscopy (AFM)
    • Thermogravimetric Analysis (TGA)
  • Gallery
  • Contact Us
    • Submissions
    • Quote Request
  • Our Menu

Analyses & Consultation

PhotoMetrics provides analyses and consultations in a broad range of areas.

Analyses & Consultations

Adhesive Failure Analysis
Chemical and Material Analysis
Coating Thickness and Composition
Contamination and Corrosion Identification
Failure Analysis
Litigation Support
Metallurgical Failure Analysis
Semiconductor Constructional Analysis
Surface Analysis
Surface Roughness
Thermal Analysis TGA

WHAT WE DO


PhotoMetrics provides solutions, not just data. Because a team approach is the most effective way to solve problems, we encourage client involvement.

RESULTS


By combining your input, our staff, and the proper analytical techniques, we can assure you a rapid solution to your materials or process challenges.

CONTACT US


Phone: 714-895-4465

Fax: 714-893-4682

E-mail: lab@photometrics.net

ADDRESS


PhotoMetrics, Inc.

15801 Graham St.
Huntington Beach, CA 92649

Directions