• Home Page
  • About Us
  • Analyses & Consultation
    • Adhesive Failure Analysis
    • Chemical and Material Analysis
    • Coating Thickness and Composition
    • Contamination and Corrosion Identification
    • Failure Analysis
    • Litigation Support
    • Metallurgical Failure Analysis
    • Semicondustor Constructional Analysis
    • Surface Analysis
    • Surface Roughness
    • Thermal Analysis TGA
  • Analytical Techniques
    • Differential Scanning Calorimetry (DSC)
    • Energy Dispersive Spectroscopy (EDS)
    • Field Emission Scanning Electron Microscopy (FESEM)
    • Fourier Transform Infrared (FTIR) Spectroscopy
    • In-Lens Field Emission Scanning Electron Microscopy (In-Lens FESEM)
    • Optical Microscopy
    • Scanning Auger Microanalysis (SAM)
    • Scanning Electron Microscopy (SEM)
    • Scanning Probe Microscopy (SPM)/Atomic Force Microscopy (AFM)
    • Thermogravimetric Analysis (TGA)
  • Gallery
  • Contact Us
    • Submissions
    • Quote Request
  • Our Menu
Quick Turnaround

Slide4

Posted on October 23, 2015October 28, 2015 by PhotoMetrics
Quick Turnaround
Posted in Slideshow.

Post navigation

← Slide3
Slide5 →

Recent Posts

  • Slide5
  • Slide4
  • Slide3
  • Slide2
  • Slide1

Recent Comments

    Archives

    • October 2015

    Categories

    • Slideshow

    Meta

    • Log in
    • Entries feed
    • Comments feed
    • WordPress.org

    WHAT WE DO


    PhotoMetrics provides solutions, not just data. Because a team approach is the most effective way to solve problems, we encourage client involvement.

    RESULTS


    By combining your input, our staff, and the proper analytical techniques, we can assure you a rapid solution to your materials or process challenges.

    CONTACT US


    Phone: 714-895-4465

    Fax: 714-893-4682

    E-mail: lab@photometrics.net

    ADDRESS


    PhotoMetrics, Inc.

    15801 Graham St.
    Huntington Beach, CA 92649

    Directions